SII Nano Technology X-Vision 200TB FIB-SEM System

Description

SII Nano Technology X-Vision 200TB FIB-SEM System, 200-230V, 50/60Hz, w/ gallium SMI3000 ion source, 3ea Varian ion pumps, Thermo Electron UltraDry silicon drift detector p/n 8827A-3UUS-SN, Matsusada HEOS-828B-SD HV power supply, BOC Edwards STP-iX455 chamber turbopump, Pfeiffer loadlock turbopump, IOS unit 10 p/n 1014-5002, Raith BB-8KV beam blank controller. Serial no. 1110378000011. Mfg 2008. Includes: 1ea control cabinet w/ Anelva PIC-050A-NP ion pump controller, BOC Edwards pump controller, Pfeiffer DCU pump controller, Ar control unit p/n 1015-5017, 1ea FT200 stage controller p/n 1208-5003, PDU p/n 1207-5000; 1ea 4chMGS II gas control cabinet, m-code K-A111004015; 1ea control console w/ maintenance panel, control PB rack p/n 1012-5027, vacuum power unit p/n 1208-5001, stage monitor, SEM scan module p/n 1207-5110; 2ea 1208-5000 transformer boxes; 1ea Thermo Scientific Noran System 7 microanalysis controller, p/n 470-3597; 1ea spare Raith beam blank controller, type BB-8kV; 1ea Thermo Electron C10017 silicon drift detector controller; 1ea Jandel model RM2 4-point test controller; 3ea control PCs (no HDDs).