FEI Tecnai Osiris 200 kV Scanning Transmission Electron Microscope (Scanning TEM)

Full Description

FEI Tecnai Osiris 200 kV Scanning Transmission Electron Microscope (Scanning TEM), functional and currently in use by users on campus. System is currently under service contract and has been under service contract since installation. Has a newer Gatan CMOS Rio 16 Megapixel Camera added in 2019. Out of 4 EDS detectors of SuperX, one is broken. Gatan EELS option is also not operational (removed from the TEM). The FEI Osiris is an advanced analytical transmission electron microscope (TEM/STEM) designed for high-resolution imaging and rapid chemical mapping using energy-dispersive X-ray spectroscopy (EDX). Operating at 200 kV, with an additional 80 kV configuration for beam-sensitive materials, the instrument features an FEI XFEG Schottky field-emission gun capable of beam currents up to 50 nA. The FEI Tecnai Osiris STEM system with SuperX EDX system (ChemiSTEM technology) has 4 EDX detectors. One EDX detector (detector 4) is not working now, but users are still able to do the EDX mapping with the other 3 EDX detectors. The system was upgraded with a CMOS Gatan Rio 16-megapixel camera in 2019. Osiris STEM now has a new refurbished high-tension tank, replaced in October 2026. The following parts were repaired or replaced. The LN tank, the beam control boards, the motors and control parts for the goniometer, the selected area aperture control, and the goniometer position, the microscope PC. Gatan Rio 16 camera (Ametek, Gatan) was repaired twice. One online and one onsite. The buyer can also take the Gatan Enfina 876 EELS spectrometer (EELS spectrometer was removed from Osiris, will turn ON and but couldn't do any measurements). The issue with EELS was that the zero peak was not stable. System Specifications Beam Energy: 200 kV (alignment at 80 kV also) Source: X-FEG high-brightness Schottky field emitter Analytical System: Integrated Super-X energy-dispersive X-ray (EDX/EDS) setup with 4 windowless Silicon Drift Detectors (SDD) STEM Detector Types BF (Bright Field) Detector: Collects unscattered or central beam electrons; displays mass-thickness and diffraction contrast. DF2 (Dark Field 2) Detector: Intermediate annular detector capturing inner scattered electrons. DF4 (Dark Field 4) Detector: Intermediate-to-outer annular dark-field detector for Z-contrast and structural features. HAADF (High-Angle Annular Dark Field) Detector: Collects incoherently scattered high-angle electrons for atomic number (Z-contrast) sensitive imaging down to 0.18 nm resolution. Also, electron diffraction via Selective Area Electron Diffraction and Microdiffraction can be done. ***Pick up by appointment between 9:00 am - 4:00 pm M-F. The instrument is located inside the NCMN - Electron Nanoscopy Instrumentation Facility. The buyer will be responsible for all costs associated with crating/boxing, and shipping. UNL will be responsible for deinstallation and relocation of equipment to space next to the Physics loading dock with the help of OEM (Thermofisher FEI engineers). We will not be liable for any damage that occurs during transportation of the tool after it leaves our dock. The Osiris STEM should be purchased 'as-is and where-is' without warranty. Osiris can be released immediately after sale. The release date depends on the scheduling of the decommission process by the Thermofisher engineers. Sale price is not negotiable. University of Nebraska Fleet Management: http://transportation.unl.edu/http://transportation.unl.edu/